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or contact resonance
5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Aluminum
21330-25 - Substratek™
Micro/Macro XRF
HS-20MG Tempfix™ or contact resonanceHeight Calibration Standard, 20 nm DESCRIPTION Height Calibration Standard, 20 nm The problem: Atomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated. The solution: HS 20MG is one of the height standards introduced by BudgetSensors as a
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