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4 N/m nominal
Enjoy up to 20X faster survey scan rates and up to 6X faster scans with no loss of resolution
The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0
Other applications of this probe include: Scanning Capacitance Microscopy (SCM)
SMIM-150 Hysitron Probes 4 N/m nominalsMIM probes, 75 kHz, 8 N m, 5 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Nitride probe with shielded co axial sensor for sMIM. Nominal 75 kHz, 8 N m 5 Probes Tip Geometry: Pyramid Tip Height: 4. 5 5. 5 Front Angle: 35 1 Back Angle: 35 1 Side Angle: 35 1 Tip Radius (Nom): 50 10 Tip Coating: TiW Cantilever Material: Silicon Nitride Cantilever Thickness (Nom): 3. 6 Cantilever Thickness (RNG): 3. 3 3. 9 Cantilever Geometry: Rectangular
