SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards 15 nm 5KHZ DESCRIPTION

5KHZ DESCRIPTION

Imaging in both secondary and back scattered mode is very high

Styles available are Square Mesh

50 and 500µm pitch patterns and X & Y Micro-ruler

SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards 15 nm 5KHZ DESCRIPTIONDESCRIPTION MRS 4 Reference Standard, X, Not Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y Z, Traceable, without Protective Retainer, Unmounted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron