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This sample shown domains when imaged in SCM mode
The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip
" and "F"cantilevers on the other side of the probe
Tipless cantilever
TESP-V2 2 nm This sample shown domains when37N m, 320kHz, No Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, TESP TESPA AFM probes. Brukers new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode and non contact mode in
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