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Ships within 48 hours · Estimated delivery Oct 14 - Oct 19
Width x Thickness 5046-SV ESD Safe
Large Ø25
Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as:
See Hitachi M4 Holders if you have a Hitachi SEM
ElectriTap300-G s-SNOM Probes Width x Thickness 5046-SV ESDElectrical, Tapping Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Tapping Mode AFM Probe Monolithic silicon AFM probe for high frequency non contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample
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