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Thin Specimen Split Mount Holder
A 10-pack of probes for contact mode imaging and nanoIR spectroscopic measurements
A 1" binder accommodates two BEEM® mounting panels and a 1-1/2" binder will hold three mounting panels
Ø25 x 10mm H for JEOL
Pelcotec™ G-1 Silicon Calibration Specimen - 1µm Pitch Reflex Aluminum Thin Specimen Split Mount HolderDESCRIPTION Includes 1m, 10m and 100m pitch The Pelcotec G 1 calibration specimen with a 1m pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range. Can be used for SEM, Auger, Sims, FIB, and LM (reflected light). Specimen may also be mounted directly on the Pelcotec G 1 which will give an accurate internal calibration in the image. Particularly useful when working with powders.
