45° Multi Holder for 3 Pin Stubs Gilder This AFM probe is unmounted

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2

2mm (1/8") diameter x 6

Al reflective coating

This sample holder is similar to the cross-sectional sample holder (Model SD-103) but specifically designed for vertically holding soft materials up to 3mm thick or small samples with milimeter dimensions

45° Multi Holder for 3 Pin Stubs Gilder This AFM probe is unmountedDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain