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DSCMSCH Critical Dimension (Overhang) electrically conductive tip that is

SKU: 83361403576

4.6
EUR1634.88 EUR1664.88

Pay in 4 interest-free payments of $408.72 Learn more

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  • USA
  • CAN

Ships within 48 hours · Estimated delivery Oct 26 - Oct 31

Description

electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM)

and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs

Max Width = 50 nm

Cantilever Material: 0

DSCMSCH Critical Dimension (Overhang) electrically conductive tip that isSCM cantilever holder for Dimension series SPMs DESCRIPTION This SCM cantilever holder supports the Scanning Capacitance Microscopy (SCM) application module for Dimension BioScope SPMs. The integrated piezo can be actuated for TappingMode or LiftMode operation. The holder comes with a short cable for connection to the SCM application module.

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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