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SAA-HPI-SS 30 nm conductivity measurements (C-AFM and PeakForce

SKU: 75130588769

4.3
USD647.07 USD673.07

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Ships within 48 hours · Estimated delivery Sep 1 - Sep 6

Description

conductivity measurements (C-AFM and PeakForce TUNA)

New imaging mode allows quantitative mapping of nano-mechanicalproperties including elastic modulus

these probes provide extreme wear resistance

combined with a high 40N/m spring constant

SAA-HPI-SS 30 nm conductivity measurements (C-AFM and PeakForceScanAsyst Air HPI Super Sharp Probes, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS New super sharp probes for highest resolution imaging in air on the widest sample range. Optimized for PeakForce Tapping operation in air. Recommended for use with any PeakForce Tapping enabled Bruker AFM. Combines a tip with 1 nm nominal end radius and moderate 0. 25 N m spring constant for reliable highest resolution imaging on any sample,

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