PELCO® AFM Tip and Resolution Test Specimen Select:Unmounted Low vertical edge height

Name: PELCO® AFM Tip and Resolution Test Specimen Select:Unmounted Low vertical edge height
Brand: 2m-capital.com
SKU: 74758813334
Price: 123.67 USD
Availability: InStock
Rating: 4.3438 (13 reviews)

SKU: 74758813334

4.3

USD123.67 USD158.67

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Description

Low vertical edge height

Sliding cover

24 blocks of 9 cells

G100HEX: Pitch 250µm

PELCO® AFM Tip and Resolution Test Specimen Select:Unmounted Low vertical edge heightDESCRIPTION This product is intended for checking the tip sharpness (not height calibration); AFM tips wear down and can get damaged resulting in blurry lines, especially at the nano scale. For example, a worn tip would have the cobalt particles looking oblong rather than round. The second feature of this product is in helping the microscopist get down to the nanoscale. having a uniform coverage of nanoscale features, you know what to look for and

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