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100-200 mesh
Tipevaluation software provides on-command "worst case" probeshape diagnosis based on scanning of this roughness sample
The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy
- TERS probes for 633 nm or 785 nm excitation using STM feedback
SEM Magnification Standard and Stage Micrometer MRS-4 - Retainer for MRS-4 13kHz 100-200 meshDESCRIPTION Protective Retainer for MRS 3 4, SEM, 1" x 0. 125" (25. 4 x 3. 18mm) with clear hole for transmission measurements. Standard recessed 0. 02" (0. 5mm) The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies
