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Ø100mm Pin Stub
although only 10nm of carbon is evaporated onto the plastic
colloidal gold particles may be used to calibrate the vertical dimensions of atomic force microscopy at the nanometer level
Splash guard holds and seals the cantilever holder and seals on end of a standard Icon scan head to prevent moisture from entering the head
Low profile 36° FIB mount with short pin (6mm) for ZEISS/LEO TEM Grid Staining Chemicals Ø100mm Pin StubDESCRIPTION These special low profile pin mounts are available as flat, as a 90 mount, and with specific angles ideally suited to accommodate specimens with small working distances in FIB, DualBeam and CrossBeam systems. Made out of aluminum. Fully compatible with standard pin stub mounts (pin 3. 2mm diameter) for sample storage and transport. These mounts can be used directly in FEI and TESCAN systems with the standard pin length and ZEISS LEO
