145nm Pitch Calibration Standard for AFM 50 kHz two dimensional array accurate to

two dimensional array accurate to ±1nm

These 76 mm evaporation covers are identical to the DEV60-5S but are available in fluorosilicone in packages of five

Super sharp tip for highest resolution combined with intermediate spring constant for applications including:

Grids have standard diameter of 3

145nm Pitch Calibration Standard for AFM 50 kHz two dimensional array accurate toDESCRIPTION 145nm AFM Reference Standard, Certified, Non traceable, Mounted on disk: 145nm Very High Resolution AFM Reference Standard on 12mm steel disk 145nm AFM Reference Standard, Certified, Non traceable, Unmounted: 145nm Very High Resolution AFM Reference Standard, Unmounted Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements. Period: 145nm pitch nominal, one dimensional array. Accuracy is +