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The kit contains 8 numbered 15mm AFM discs with mica attached for calibration and tip characterization
The fabrication process ensures excellent uniformity of the structures across the chip
Materials are Cu
Packaging: 100 grids per vial/tube
SiC-STEP Calibration Samples 300 Mesh The kit contains 8 numberedDESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
