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This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2
Built on the high-performance RESP-10 AFM probe
These probesare ideal for C-AFM
1nm and is ideally suited to determine the resolution of electrical probes or for imaging techniques such as Scanning Electron Microscopy
DDESP-FM-V2 1 N/m This AFM probe is unmounted6 N m, 105 kHz, Conductive Doped Diamond Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker DDESP FM V2 Electrical Probes Providing consistent performance and high sensitivity. Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and
