Pay in 4 interest-free payments of $192.18 Learn more
Ships within 48 hours · Estimated delivery Oct 15 - Oct 20
This sample shown domains when imaged in SCM mode
Arrays of structures with different shape and pitch are integrated on the chip
This particular material choice prevents "binding" of parts in the SEM stage
Many types of samples can be mounted directly onto the Silicon Test Specimen so that an internal calibration is obtained in the image
ATEC-FMAu-10 ESD Safe This sample shown domains whenDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for force modulation mode, detector and tip side: Au coating
US$ 79.74
US$ 34.89
US$ 111.67
US$ 430.82
US$ 430.82
:max_bytes(150000):strip_icc()/quitters-flu-2824817-5bf4777dc9e77c0051e9660c.png)
