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cross-coupling effects and for determination of the tip aspect ratio
allow for precise movements and are available in stainless steel
Dimensions: 75 x 65 x 7
similar in geometry to standard Silicon AFM probes but incorporate a resistive heater at the end of the cantilever
Shorter pin for all ZEISS/LEO SEM, FESEM & FIB Systems, Ø12.7mm x 6mm pin height Unit:pkg/1000 cross-coupling effects and for determinationDESCRIPTION Shorter pin for all ZEISS LEO SEM, FESEM & FIB Systems, 12. 7mm x 6mm pin height ZEISS LEO SEM, FESEM & FIB Systems, aluminum, grooved edge, 12. 7mm
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