SEM Magnification Standard and Stage Micrometer MRS-4 - Specimen Mounts 80 N/m Unmounted for all AFMs

Unmounted for all AFMs

5 Tip Radius (Nom): 5 Tip Radius (Max): 8 Tip Set Back (Nom): 1

All cantilevers on the sharpened Microlever probes have less than 2 degrees of cantilever bend

MultiMode SPM

SEM Magnification Standard and Stage Micrometer MRS-4 - Specimen Mounts 80 N/m Unmounted for all AFMsDESCRIPTION Mounting MRS 3 4 Retainer on 1" (25. 4mm) Pin Stub with a 1 8" (3. 2mm) pin, for #614 5 only Mounting MRS 3 4 Retainer on Hitachi 25x10mmxM4 Cylinder Mount, for #614 5 only The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version)