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This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2
This holder supports Electrostatic Force Microscopy (EFM)
Microfabricated silicon probes that are ~225 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever
Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air
VITA-DM-GLA-1 NanoIR Probes for AFM-IR This AFM probe is unmountedVITA SThM, 150um, 0. 5N m, 50kHz DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS SThM probes for Dimension SPMs, 150 micron length. Note: Small adjustments of camera position may be needed for probe viewing. Specifically designed for use with VITA module. Uses other than with VITA module void probe warranty. Highly static sensitive. Do not measure resistance with conventional resistance meters. Not compatible with previous generation SThM
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