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Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices
Feature sizes: 2mm
15468 - PELCO® Double 1/2" FIB Sample and Grid Holder
08mm 5622-NM DUMOSTAR High Precision 5 110mm NM-SS 0
New Style T-Base Adapter for Hitachi 15AP Bruker's new conductive diamond coatedDESCRIPTION New Style T Base Adapter for Hitachi S 4800, SU 70, SU6600, SU8200 and SU8000 series FESEMs Made of vacuum grade aluminum with counterpart for airlock manipulator and locking rod. Can be used with any of the Modular SEM Specimen Holders if the SEM stage travel permits this. Includes M4 screw.
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