292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids 10 & 20nm range

10 & 20nm range

and an entry hole for counter and reference electrodes are integrated into the glass fluid cell

5º Tip Radius (Nom): 25 Tip Set Back (Nom): 11

or probes in the unmounted probe carrier (model 00-107-0091)

292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids 10 & 20nm rangeDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable