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Ships within 48 hours · Estimated delivery Nov 1 - Nov 6
35mm (1/4") and a pin stub at 45°
Step height: ~500nm (the precise value is stated on the label of each box)
16mm) or 22x22mm with thickness #2 (0
Titanium roughness sample DESCRIPTION
ElectriTap190-G Select Quantity:50 per set 35mm (1/4") and a pinElectrical, Tapping Mode AFM Probe with Long Cantilever DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Tapping Mode AFM Probe with Long Cantilever Monolithic silicon AFM probe for high frequency non contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more
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