FIB3D2-100 26 N/m Includes 10 O-rings

Includes 10 O-rings

025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 5

Includes a precision machined mount which references the probes in the correct position on the half washer

PeakForce Tapping Hi-Res Probe B

FIB3D2-100 26 N/m Includes 10 O-rings42N m, 320kHz, 10nm Tip Radius, 100nm Wide Spike @ 2m, 3deg tilt compensation DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS The FIB3D2 100 has a 100nm wide spike at 2 um from the spike apex. Thespike is tilt compensated by 3 degrees and the cantilever is uncoated. Focused Ion Beam (FIB) probes consist of an integrated single crystal TESP silicon cantilever and tip that have been machined (or shaped) toobtain the desired high aspect ratio.