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7mm (1/2") pin mounts in 5 drawers
lateral calibration of SPM scanners and detection of any lateral nonlinearity
Max EL = 500 nm
The structure symmetry makes it possible to calibrate your AFM system in one step without rotating the sample in-between X- and Y-axis calibration
PPP-NCH <20 nm 7mm (1/2") pin mounts inDESCRIPTION POINTPROBE PLUS SILICON SPM PROBE SILICON CANTILEVER FOR NON CONTACT TAPPING MODE
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