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Holds Hitachi M4 mounts secure on M4 screw adapters
HIGH ASPECT RATIO tip
1mm 5075 PELCO® ESD Safe Ergo Tweezers
Spring constants are individually calibrated and guaranteed within 10%
BSE Atomic Reference Specimen Dumont 70 Holds Hitachi M4 mounts secureDESCRIPTION Back Scattered Electron Test Specimens An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen. Four reference specimens are now available that are suitable for testing the atomic number contrast performance of a backscattered electron detection system. Each of the reference specimens
