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Back Scattered Electron Test Specimens
The 2D holographic Array with 144nm is recommended because of the unique characteristics that make it especially easy to use
UK and Germany
forensics and delicate wafer handling
60806-5 - Planotec GSR & Particle Analysis Calibration Kit Select:Planotec GSR Calibration Kit Back Scattered Electron Test SpecimensDESCRIPTION Kit contains two test specimens: one with synthetic GSR particles and one with synthetic particles for automated particle analyses using SEM EDX. SPS Test Specimen with Synthetic GSR particles. This Synthetic Particle Specimen (SPS) has been specifically designed for the adjustment and validation of analytical SEM EDX systems used for automated analysis of GSR samples. It is especially useful for quick system validation checks and quality
