SD-103 Hi-Res Check Scan line profile and

Check Scan line profile and enlarged view of the tip apex

3 cantilevers: 0

Replacement scanner springs for all V and VLH type scanners

5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtSi Back Side Coating: Reflective Al

SD-103 Hi-Res Check Scan line profile andSPM cross sectional sample holder DESCRIPTION SPM cross sectional sample holder for all Veeco SPMs. This cross sectional sample holder is designed to hold a wafer cross section upright for edge inspection and it can be used on all microscopes; However, cross section cannot be taller than the height supported by the microscope. It is 0. 5" in diameter and 0. 175" tall. Includes a hex key.