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curved tips 7 115mm NM-SS 0
scanning capacitance microscopy (SCM)
619 (417KB PDF)
electrostatic force microscopy (EFM)
PR-UM-PFIR-A-10 80 N/m curved tips 7 115mm NM-SSDESCRIPTION SPECIFICATIONS A 10 pack of probes for PeakForce Tapping mode imaging and nanoIR spectroscopic measurements. Unmounted for use on Brukers IconIR system or others systems that can take a standard cantilever chip. This 150khz tapping mode probe has a full wrap gold coating, on the reflex side for increased feedback laser signal, on the tip side to enable nanoIR measurements. General Specifications Feature Value Geometry Rectangular Tip
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