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Springloaded Vise Clamp Select:Vise Clamp Theseprobes also have a tip

SKU: 2609739544

4.5
USD288.98 USD335.98

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Description

Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods

Width x Thickness 5048-SV ESD Safe SV Carbon Wafer Tweezers

The PELCO® Universal SEM Sample Holder Set extends the capabilities of your SEM by offering convenient sample holders for larger or awkwardly shaped samples

203mm (8")

Springloaded Vise Clamp Select:Vise Clamp Theseprobes also have a tipDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

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