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Sometimes "pitch" is used in this terminology and it is the equivalent of hole width plus bar width
DDFMLSP DESCRIPTION
Calibration Specimen for Scanning Tunneling Microscope
making them easier to use and providing a much better seal than the previous circular cross-section rings
Block Test Gratings for Z-axis PeakForce Tapping Enabled Bruker AFM Sometimes "pitch" is used inDESCRIPTION Selection of 3 block type test gratings with different step heights intended for Z axis calibration of scanning probe microscopes and linearity measurements. Structure: Si Wafer with SiO2 layer for grating Pattern type: 1 Dimensional (in Z axis direction) Step heights: 201. 5nm for TGZ 20 1102nm for TGZ 100 5203nm for TGZ 500 Period: 3 0. 01m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 3 x 3mm Note: Values for step heights
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