Magnification Calibration MRS-3 - Magnification Reference Standards 4 N/m boxes 2µm 1µm 500nm 200nm

boxes 2µm 1µm 500nm 200nm

30 kHz in fluid

while keeping the remainder of the grid surface flat prior to picking up ribbons

Sold in packs of 10

Magnification Calibration MRS-3 - Magnification Reference Standards 4 N/m boxes 2µm 1µm 500nm 200nmDESCRIPTION MRS 3 Reference Standard, X, Not Traceable, without Protective Retainer, Unmounted MRS 3 Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted MRS 3 Reference Standard, X Y Z, Traceable, without Protective Retainer, Unmounted The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB