JN-1 SEM Demonstration Specimens Strong Structure geometry:

Structure geometry:

grooved tips 108 120mm NM-SS 1

The special clean dicing process involves coating the wafer with photo resist before dicing and removing it after dicing which produces debris-free SiO2 substratres

The world's first probe targeted at delivering high resolution on single biomolecules

JN-1 SEM Demonstration Specimens Strong Structure geometry:DESCRIPTION SAMPLE IMAGES The JN 1 Scanning Electron Microscope Demonstration Standard Specimen demonstration samples on two standard 12. 7mm (1 2") pin stubs and a 25mm mounting adapter. They allow for demonstrating any SEM at lower magnifications with known specimens. The variety of demonstration samples can also be used for training purposes. They are ideal for use on table top SEMs such as the JEOL NeoScope, Hitachi TM 1000 3000 3030, Phenom and