All-In-One-DD SEM Magnification Standard and Stage Micrometer MRS-4 bent at 45 degrees 5/45

bent at 45 degrees 5/45 105mm NM-SS 0

A beryllium half grid is also added for ultimate test of low end detector performance

FastScan-A probes are designed specifically for imaging in air on the Dimension FastScan AFM

without peeling off the backing

All-In-One-DD SEM Magnification Standard and Stage Micrometer MRS-4 bent at 45 degrees 5/45Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping non contact mode and electric modes such as: scanning