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Bruker's robust Silicon Nitride AFM probes have soft Silicon Nitride cantilevers with Silicon Nitride tips
-- Perfluoro elastomer (FFKM) for maximum solvent compatibility
- Probe holder for application module-equipped MultiMode SPMs
This is for use with the NanoScope tip-evaluation software
MMEFCH TEM Grid Storage Boxes Bruker's robust Silicon Nitride AFMElectric field cantilever holder DESCRIPTION TIP SPECIFICATIONS Electrostatic Force Microscopy (EFM) probe holder for the Multimode SPM. This stainless steel probe holder enables electric field gradient imaging for the MultiMode SPM. The holder provides electrical contact to the AFM tip through both the cantilever clip and the stainless steel cantilever pocket. An integrated piezo oscillates the tip for TappingMode. This holder can also be used for
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