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even at high temperatures
only minor impurities of Al and Si may be found
15mm diameter
shown with silicon chips held in place
PELCO X-CHECKER™ Wafer Size:300mm (12") even at high temperaturesDESCRIPTION The PELCO X Checker Wafer is available for systems set up for silicon wafer handling. The PELCO X Checker Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations. The #602 20 and #602 21 contain: Copper disc to check spectral calibration Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution Nickel 400 mesh TEM grid for imaging
