High Resolution Test Specimen, Gold on Carbon 2 Mount:Mount F This AFM probe is unmounted

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model FESPA-V2

The previously stored location should now be in the field of view

b) High density polyethylene (HDPE

2mm (1/8”) pin

High Resolution Test Specimen, Gold on Carbon 2 Mount:Mount F This AFM probe is unmountedDESCRIPTION PRODUCT SPECIFICATIONS particle size range from <3nm to 50nm Particularly suited for assessing the image quality of high resolution SEMs, such as those fitted with a field emission source. A magnification of at least x80,000 is required to clearly resolve the gold particles. 6mm dia. x 2mm. See mount selection A Q SEM High Resolution, Gold on Carbon Test Specimens Scanning electron microscope (SEM and Focussed Ion Beam (FIB) system