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Micron Locater Grids
sample preparation
4mm x 3mm Hex Socket type 1 Cup Pt-SS
2mm (1/8") hole in the top and M4 thread in the base are available in 4 sizes:
Aluminum-Tungsten Dendrites Silicon Dioxide Support Films Micron Locater GridsDESCRIPTION medium resolution test for Scanning Electron Microscopy Aluminum Tungsten Dendrites Test Standard The various spacings created by the dendritic structure give the gap test. The topographical arrangement of dendrites leads to the gray level test. The specimen is non magnetic, vacuum clean, has no adverse reaction to the electron probe and requires no surface coating. It is most useful for working in the probe size range of 25 to 75nm. This
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